Author(s): B. S. Sathish, R. Murugesan, L.M.I. Leo Joseph, V. Kalist, Ganesan P

Email(s): subramanyamsathish@yahoo.co.in , rmurugesan61@gmail.com , leojoseph@srecwarangal.ac.in , kalist.v@gmail.com , gganeshnathan@gmail.com

DOI: 10.5958/0974-360X.2019.00869.2

Address: B. S. Sathish1, R. Murugesan2, L.M.I. Leo Joseph3, V. Kalist4, Ganesan P5*
1Department of Electronics and Communication Engineering, Ramachandra College of Engineering, Eluru, India.
2Department of Electronics and Communication Engineering, Malla Reddy College of Engineering and Technology, Secunderabad, Telangana, India.
3Department of Electronics and Communication Engineering, S.R.Engineering College, Warangal, India.
4Department of Electronics and Communication Engineering, Sathyabama Institute of Science and Technology.
5*Department of Electronics and Communication Engineering, Vidya Jyothi Institute of Technology, Hyderabad.
*Corresponding Author

Published In:   Volume - 12,      Issue - 10,     Year - 2019